Á¦23ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ

Final Program
2¿ù 22ÀÏ (¿ù)
2¿ù 22ÀÏ(¿ù) Room A Room B
Źé·ë(5Ãþ) ÇÔ¹é·ë(5Ãþ)
14:00-18:00 [Short Course 1]
3Â÷¿ø ÁýÀû ±â¼ú: ¿ø¸®¿Í ÀÀ¿ë
[Short Course 2]
Â÷¼¼´ë ÀúÀü·Â¼ÒÀÚÀÇ °³¹ß°ú ¼³°è
2¿ù 23ÀÏ (È­)
2¿ù 23ÀÏ(È­) Room A Room B Room C Room D Room E Room F Room G Room H Room I Room J Room K Room L
5Ãþ 6Ãþ 5Ãþ
ŹéI ŹéII+III ÇÔ¹éI ÇÔ¹éII+III ÄÁº¥¼ÇȦL ºÀ·¡I ºÀ·¡II+III À°¹éI À°¹éII û¿ÁI û¿ÁII+III ·Îºñ
08:30-10:30 [TA1-L] [TB1-D] [TC1-F] [TD1-G] [TF1-I] [TG1-F] [TH1-J] CDC [TJ1-K] [TK1-R] Chip
Design
Contest
& Àü½Ã
Analog
Design I
1D/2D
Materials
&
Devices
Novel Si
Devices
and
Integrated
Circuits (4)
Device
Physics and
Characte-
rization
1 :Field-
effect
transistors,
thin-film
transistors,
and 3D
inverter
¡¡ High
efficiency
sensors
and
devices
Novel Si
Devices
and
Integrated
Circuits (1)
Nano-
fabrication
for
Application
Memory
processing
and RRAM
operation
Interaction
of system
SW and
semi-
conductor
10:30-10:40 ÈÞ½Ä (& Ä¿ÇÇ, ´Ù°ú)
10:40-12:40 [TA2-L] [TB2-D] [TC2-M] [TD2-G] [TF2-O] [TG2-F] [TH2-J] [TJ2-K] [TK2-R]
Analog
Design II
Oxide
Semi-
conductors
RFIC
and smart
RFID
tags
Reliability
Analysis :
Thin-film
transistors
and field-
effect
transistors
VLSI
System
Design
for
Communi-
cations
Novel Si
Devices
and
Integrated
Circuits (2)
Nano-
fabrication
for
Application
NAND,
PCRAM,
and
MRAM
Little more
faster, and
even
better
reliability
12:40-13:40 Á¡½É [Æ÷·¹½ºÆ®º¼·ë / 4Ãþ]
13:40-14:20 ±âÁ¶°­¿¬ 1 : Prof. Akira Toriumi (The University of Tokyo)
"Materials Innovation for Versatile Electron Devices in IoT Era"
[ÄÁº¥¼ÇȦ K+W / 5Ãþ]
14:20-15:00 ±âÁ¶°­¿¬ 2 : ¹ÚÀç±Ù ±³¼ö (ÇѾç´ëÇб³)
" Nonvolatile Memory Tech-nology beyond 20nm : Dilemma & Challenge"
[ÄÁº¥¼ÇȦ K+W / 5Ãþ]
15:00-15:10 ÈÞ½Ä (& Ä¿ÇÇ, ´Ù°ú)
15:10-17:10 [TA3-A] [TB3-D] [TC3-H] [TD3-G] [TF3-Q] [TG3-F] [TH3-J] [TI1-N] [TJ3-K] [TK3-E]
A2:
Enabling
packaging
tech-
nologies
Process
Tech-
nology
for Thin
Films
Display
and
Imaging
Tech-
nologies
Device
Modeling
and
Simulation
1 : RF,
teraherz,
low-power,
and novel
devices
Metrology
and
Inspection I
Novel Si
Devices
and
Integrated
Circuits (3)
Graphene
and
Related
Carbon
Nano-
structures
Advances
in Design
Tech-
nology
Circuit
related
topics
and
memory
selectors
Advanced
GaN
Tech-
nology
17:10-18:30 Æ÷½ºÅÍ
¼¼¼Ç1
[TP1]
18:30-20:00 ¸¸Âù [ÄÁº¥¼ÇȦ K+W / 5Ãþ]
20:00- Rump Session 1 : ½ºÄÉÀϸµ ÇÑ°è ±Øº¹À» À§ÇÑ ¹Ì·¡ ¹ÝµµÃ¼ ±â¼ú [Źé·ë / 5Ãþ]
Rump Session 2 : ÃÊ¿¬°á »çȸÀÇ ¹ÝµµÃ¼ ±â¼ú Àü¸Á°ú °úÁ¦ [ÇÔ¹é·ë / 5Ãþ]
2¿ù 24ÀÏ (¼ö)
2¿ù 24ÀÏ(¼ö) Room A Room B Room C Room D Room E Room F Room G Room H Room I Room J Room K Room L
5Ãþ 6Ãþ 5Ãþ
ŹéI ŹéII+III ÇÔ¹éI ÇÔ¹éII+III ÄÁº¥¼ÇȦL ºÀ·¡I ºÀ·¡II+III À°¹éI À°¹éII û¿ÁI û¿ÁII+III ·Îºñ
08:30-10:00 [WA1-A] [WB1-D] [WC1-C] [WD1-G] [WF1-Q] [WG1-F] [WH1-J] [WI1-N] [WJ1-K] [WK1-E] Àü½Ã
A1: Contact
and thin
film tech-
nologies
for high
performance
interconnect
Thin
Films for
Emerging
Devices I
Materials
Growth &
Characte-
rization :
Emerging
new
electrical
materials
Device
Physics
and
Characte-
rization 2 :
Memory
devices
Metrology
and
Inspection
II
Materials
and
Processing
Tech-
nologies
Two-
Dimensional
Materials
beyond
Graphene
Architecture
-Level
Design
Techniques
Uncon-
ventional
approa-
ches
in memory
research
GaN
Power
Device
10:00-10:10 ÈÞ½Ä (& Ä¿ÇÇ, ´Ù°ú)
10:10-11:40 [WA2-A] [WB2-D] [WC2-C] [WD2-G] [WF2-O] [WG2-F] [WH2-J] [WI2-B] [WJ2-P] [WK2-E]
A3: Novel
interconnect
and
packaging
tech-
nologies for
emerging
electronics
Thin
Films for
Emerging
Devices II
Materials
Growth &
Characte-
rization : III-
Nitrides
and Si
Device
Modeling
and
Simulation
2 :
Ab-initio
and
theor-
etical
study
VLSI
System
Design
and
Appli-
cations
Si and
Group-IV
Photonics
Two-
Dimensional
Materials /
Spintro-nics
Patterning Device for
Energy
(Solar
Cell,
Power
Device,
Battery,
etc.)
III-V
Device
11:40-13:00 Æ÷½ºÅÍ
¼¼¼Ç2
[WP1]
13:00- Á¡½É [Æ÷·¹½ºÆ®º¼·ë / 4Ãþ]