2¿ù 23ÀÏ(È) |
Room A |
Room B |
Room C |
Room D |
Room E |
Room F |
Room G |
Room H |
Room I |
Room J |
Room K |
Room L |
5Ãþ |
6Ãþ |
5Ãþ |
ŹéI |
ŹéII+III |
ÇÔ¹éI |
ÇÔ¹éII+III |
ÄÁº¥¼ÇȦL |
ºÀ·¡I |
ºÀ·¡II+III |
À°¹éI |
À°¹éII |
û¿ÁI |
û¿ÁII+III |
·Îºñ |
08:30-10:30 |
[TA1-L] |
[TB1-D] |
[TC1-F] |
[TD1-G] |
|
[TF1-I] |
[TG1-F] |
[TH1-J] |
CDC |
[TJ1-K] |
[TK1-R] |
Chip
Design
Contest
& Àü½Ã |
Analog
Design I |
1D/2D
Materials
&
Devices |
Novel Si
Devices
and
Integrated
Circuits (4) |
Device
Physics and
Characte-
rization
1 :Field-
effect
transistors,
thin-film
transistors,
and 3D
inverter |
¡¡ |
High
efficiency
sensors
and
devices |
Novel Si
Devices
and
Integrated
Circuits (1) |
Nano-
fabrication
for
Application |
Memory
processing
and RRAM
operation |
Interaction
of system
SW and
semi-
conductor |
10:30-10:40 |
ÈÞ½Ä (& Ä¿ÇÇ, ´Ù°ú) |
|
10:40-12:40 |
[TA2-L] |
[TB2-D] |
[TC2-M] |
[TD2-G] |
|
[TF2-O] |
[TG2-F] |
[TH2-J] |
[TJ2-K] |
[TK2-R] |
Analog
Design II |
Oxide
Semi-
conductors |
RFIC
and smart
RFID
tags |
Reliability
Analysis :
Thin-film
transistors
and field-
effect
transistors |
|
VLSI
System
Design
for
Communi-
cations |
Novel Si
Devices
and
Integrated
Circuits (2) |
Nano-
fabrication
for
Application |
NAND,
PCRAM,
and
MRAM |
Little more
faster, and
even
better
reliability |
12:40-13:40 |
Á¡½É [Æ÷·¹½ºÆ®º¼·ë / 4Ãþ] |
|
13:40-14:20 |
±âÁ¶°¿¬ 1 : Prof. Akira Toriumi (The University of Tokyo)
"Materials Innovation for Versatile Electron Devices in IoT Era"
[ÄÁº¥¼ÇȦ K+W / 5Ãþ] |
14:20-15:00 |
±âÁ¶°¿¬ 2 : ¹ÚÀç±Ù ±³¼ö (ÇѾç´ëÇб³)
" Nonvolatile Memory Tech-nology beyond 20nm : Dilemma & Challenge"
[ÄÁº¥¼ÇȦ K+W / 5Ãþ] |
15:00-15:10 |
ÈÞ½Ä (& Ä¿ÇÇ, ´Ù°ú) |
15:10-17:10 |
[TA3-A] |
[TB3-D] |
[TC3-H] |
[TD3-G] |
|
[TF3-Q] |
[TG3-F] |
[TH3-J] |
[TI1-N] |
[TJ3-K] |
[TK3-E] |
A2:
Enabling
packaging
tech-
nologies |
Process
Tech-
nology
for Thin
Films |
Display
and
Imaging
Tech-
nologies |
Device
Modeling
and
Simulation
1 : RF,
teraherz,
low-power,
and novel
devices |
|
Metrology
and
Inspection I |
Novel Si
Devices
and
Integrated
Circuits (3) |
Graphene
and
Related
Carbon
Nano-
structures |
Advances
in Design
Tech-
nology |
Circuit
related
topics
and
memory
selectors |
Advanced
GaN
Tech-
nology |
17:10-18:30 |
|
Æ÷½ºÅÍ
¼¼¼Ç1
[TP1] |
|
18:30-20:00 |
¸¸Âù [ÄÁº¥¼ÇȦ K+W / 5Ãþ] |
20:00- |
Rump Session 1 : ½ºÄÉÀϸµ ÇÑ°è ±Øº¹À» À§ÇÑ ¹Ì·¡ ¹ÝµµÃ¼ ±â¼ú [Źé·ë / 5Ãþ]
Rump Session 2 : ÃÊ¿¬°á »çȸÀÇ ¹ÝµµÃ¼ ±â¼ú Àü¸Á°ú °úÁ¦ [ÇÔ¹é·ë / 5Ãþ] |