KCS 2017 | Short Course 1 | Short Course 2 | Short Course 3 |
Àå¼Ò | Room A (¿¡¸Þ¶öµå, 2Ãþ) | Room B (ÅäÆÄÁî, 2Ãþ) | Room C (»çÆÄÀ̾î, 2Ãþ) |
ºÐ¾ß | MI & Inspection | 2D Materials | ´º·Î¸ðÇÈ |
´ëÁÖÁ¦ | Optical Technologies for Metrology and Inspection |
2D ¹ÝµµÃ¼¼ÒÀçÀÇ Æ¯¼º ¹× ÀÀ¿ë | Neuromorphic ¼ÒÀÚ ¹× È°¿ë |
»çȸÀÚ | ÀÌ»ó±æ ±³¼ö (°í·Á´ëÇб³) Biography |
À¯¿øÁ¾ ±³¼ö (¼º±Õ°ü´ëÇб³) Biography |
±Ç±â¿ø ±³¼ö (¼º±Õ°ü´ëÇб³) TBA |
¿¬»ç | ±è¿µµ¿ ±³¼ö (°æÈñ´ëÇб³) Biography Introduction to OCD |
ȲÀÇÇå ±³¼ö (¼º±Õ°ü´ëÇб³) Biography 2D ¹°¼º, ÀüÀÚ¼ö¼Û ¹× |
ÀÌÁ¾Àº ±³¼ö (¿ï»ê°úÇбâ¼ú¿ø) TBA Machine Learning and Neuromorphic-based Learning |
¾çÀ¯½Å ¹Ú»ç (»ï¼ºÀüÀÚ) Biography The Physics in the inspection technology for controlling the semiconductor process |
ÃÖ ¿õ ±³¼ö (±¹¹Î´ëÇб³) Biography 2D ´ë¸éÀû¼ºÀå, ¹ÝµµÃ¼ |
ȲÇö»ó ±³¼ö (Æ÷Ç×°ø°ú´ëÇб³) Biography Neuromorphic Device Development |